H.S. Bahedh, M.M. Abbas,  L.K. Abbas

Department of Physics, College of Science, University of Baghdad, Baghdad, Iraq

Email: muna_moussa@yahoo.com



Pulse laser system was used to deposit Bi2-xSbxPb0.3Sr1.9Ba0.1Ca2Cu3O10+δ thin films on MgO single crystal substrate were x=0.1 and 0.2. The prepared samples were characterized structurally by X-ray diffraction and morphologically by two techniques: scanning electron and atomic force microscopy. Four point probe method was used to study the electrical properties of the samples. All results are analyzed and discussed.